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III.6 Generalized ellipsometry measurements of thin-film and bulk SnO2

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N.III Current trends in spectroscopic ellipsometry I
Oral session
Nanomaterials and advanced characterization
III.6 Generalized ellipsometry measurements of thin-film and bulk SnO2 (OAV08)
G. JELLISON
31/05/2021 16:05 - 16:20